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²MµØ¤j¾Çpºâ¾÷»P³q°T¤¤¤ß¥D¥ô¡]1996-1998¡^
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¬ü°ê¥[¦{¤j¾Ç¸t¶ð¤Ú¤Ú©Ô®Õ°Ï¹q¾÷»P¹q¸£¤uµ{¾Ç¨t³X°Ý ±Ð±Â¡]1999-2000¡^
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²MµØ¤j¾Ç¿nÅé¹q¸ô³]p§Þ³N¬ãµo¤¤¤ß¥D¥ô (1999-2004)
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°ª¦Ò¹q¾÷§Þ®v¡]1982¡^
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Member¡A1995¡^
²MµØ¤j¾Ç³Ç¥X±Ð¾Ç¼ú¡]1996¡^
¤¤°ê¹q¾÷¤uµ{¾Ç·|³Ç¥X¹q¾÷¤uµ{±Ð±Â¼ú¡]1997¡^
IEEE Computer SocietyªA°È¼ú¡]1997¡^
°ê¬ì·|³Ç¥X¬ã¨s¼ú (2000, 2002)
±Ð¨|³¡²£¾Ç¦X§@¼ú¡]±Ð®v²Õ 2001, ³Õ¤h¥Í²Õ 2003¡^
IEEE Int. Workshop on Design and Diagnostics of
Electronic Circuits and Systems (DDECS) Best Paper Award (2002)
IEEE Asia and South Pacific Design Automation
Conf. (ASP-DAC) IC Design Contest Special Feature Award (2003)
IEEE ASP-DAC Best Paper Award (2003)
IEEE Fellow (2004)
±Ð¨|³¡¾Ç³N¼ú (2005)
Continuous Service Award, the IEEE Computer
Society (2005)
Outstanding Contribution Award, the IEEE Computer
Society (2005)
Golden Core Member, the IEEE Computer Society
(2006)
²MµØ¤j¾Ç³Ç¥X±Ð¾Ç¼ú (2006)
²MµØ¤j¾Ç²MµØÁ¿®y±Ð±Â (2006)
IEEE VLSI
Test Symposium (VTS) Best Innovative Practices Session Award (2007)
VLSI
Design/CAD Symposium Best Paper Award (2007)
²MµØ¤j¾Ç³Ç¥X²£¾Ç¦X§@¼ú¡]2007¡^
°ê¬ì·|NSOC¾ã¦X«¬¾Ç³N¬ã¨spµe¬ã¨s¦¨ªGÁZÀu¼ú¡]2008¡^
¥x«n¤@¤¤®Õ¤Í³Ç¥X¦¨´N¼ú¡]2008¡^
°ê®aµo©ú¼ú»ÈµP¡]2009¡^
¥x«n¥«ª÷«°°ê¤¤³Ç¥X®Õ¤Í¡]2009¡^
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l ´¿¥ôIEEE Computer Society¤UTest Technology Technical CouncilªºTechnical Meetings Group°Æ¥D®u¤Î¥D®u¡B¤ÎAsian Group¡]¨È¬w¤À·|¡^°õ¦æ©eû¡A¨Ã¥D¿ì1996¦~Asian Test Symposium¡]ATS¡A«n°ê»Ú´ú¸Õ·|ij¡^¡A¾á¥ôijµ{¥D®u¡C2000¦~¬°ATS¤j·|¥D®u¡C¦Û1993¦~°_¨C¦~§¡¨üÁܬ°ATSªºTechnical Program Committee Member¡C¦Û2000¦~¦Ü2003¦~¬°ATSªºSteering Committee°Æ¥D®u¡A¦Û2004¦~¦Ü2006¦~¬°Steering
Committee¥D®u¡C
l ¦Û1992¦~¦Ü2008¦~¬°°ê¤ºVLSI
Design/CAD SymposiumªºÄ³µ{©eû¡C1999¦~¥D¿ì²Ä¤Q©¡VLSI
Design/CAD Symposium¾á¥ô¤j·|¥D®u¡C2000¨üÁܦܤj·|ºtÁ¿¡]Invited
Speech¡^¡C¦Û1999¦~°_¬°Steering
Committeeªº©eû¡C
l ¦Û1991¦~°_¨ü¸u¬°¦h®a¤½¥q¡]µØÄˬì§Þ¡B´¼ì¬ì§Þ¡B³Ð·N¹q¤l¡B½«µØ¬ì§Þ¡B¨Ê¤¸¹q¤lµ¥¡^¤Î¬ã¨s¾÷ºc¡]¥æ³q³¡¹q«H¬ã¨s©Ò¡B¤u¬ã°|¹q³q©Ò¡B¤u¬ã°|¨t²Î´¹¤ù¬ì§Þ¤¤¤ß¡^´¹¤ù³]p»P´ú¸ÕÅU°Ý¡C
l 1990¦Ü1993¨ü³{¥Ò¤j¾Ç¸ê¤u©Ò¤§¸u¡Au¸Ó©Ò¶}±Â¶W¤j«¬¿nÅé¹q¸ô³]p»P´ú¸Õ½Òµ{¡A¨Ã¨ó§U¸Ó©Ò¦¨¥ß¶W¤j«¬¿nÅé¹q¸ô³]p¹êÅç«Ç»P¤Þ¶i¬ÛÃö§Þ³N¡A±o¥H¶}©lVLSI¤H¤~¤§°V½m»P¬ã¨s¤§¶}®i¡C
l ¬ã¨s¦¨ªG°£¤F½×¤åªºµoªí¥H¥~¡A§ó¥]¬A¤F¼Æ¤QÓ¶W¤j«¬¿nÅé¹q¸ô´¹¤ùªº³]p¹ê§@¡C
l °£¤FATS¤ÎVLSI Design/CAD Symposium¥~¡A¾á¥ô¤U¦C«n°ê»Ú¬ã°Q·|ªºÄ³µ{©eû©ÎÄw¿ì©eû¡G
² IEEE Asia and South-Pacific Design Automation
Conference¡]ASP-DAC¡^¡]1995-2004¡^
² IEEE On-Line Testing Workshop¡]1996¡^
² IEEE Test Synthesis Workshop¡]1997-2010¡^
² International Conference on Computer-Aided Design
and Computer Graphics¡]1997¡^
² IEEE Defect and Fault Tolerance ¡]DFT¡^ Symposium¡]2000-2003¡^
² IEEE Design and Test in Europe ¡]DATE¡^ Conference¡]2000-2010¡^
² IEEE VLSI Test Symposium¡]2001-2010¡^
² IEEE International Symposium on Circuits and
Systems¡]ISCAS¡^¡]2009¡^
² IEEE Memory Technology, Design and Test¡]MTDT¡^Symposium¡]2004-2009¡^
² IEEE APCCAS, DELTA, WRTLT, VLSI-TSA, VLSI-DAT,
A-SSCC, DDECS, ETS, DFY&M, etc.
l ¨üÁܾá¥ô°ê¤º¾Ç³Nºô¸ô¬ã°Q½×·|TANET96¤ÎTANET97ijµ{©eû¡C
l ¥D¿ì¥|©¡IEEE Memory Technology, Design and Test (MTDT) Symposium¡A¾á¥ô¤j·|¦@¦P¥D®u¡]2005-2007, 2009¡^¡C¦Û2006¦~°_¬°Steering
Committee©eû¡C
l ¨üÁܾá¥ôAsia-Pacific Conference on Hardware Description Language¤§Publicity Chair¡C
l ¨üÁܾá¥ôInternational Symposium on Communications¤§Publications Chair¡C
l General Co-Chair, IEEE International Symposium on
VLSI Design, Automation, and Test (VLSI-DAT), 2008-2009¡C
l Organizing Committee Chair, IEEE Asian Solid-State
Circuit Conference (A-SSCC), 2009¡C
l ¨üÁܾá¥ô°ê¤º¥~¬ã°Q·|Session Chair¼Æ¤Q¦¸¡C
l ¥D¿ì°ê¤º¾Ç³N§Þ³N·|ij¡G¶W¤j«¬¿nÅé¹q¸ô³]p»P¹q¸£»²§U³]p§Þ³NÁͶլã°Q·|¡B´O¤J¦¡®Ö¤ß»P¨t²Î¥i´ú©Ê³]p§Þ³N¬ã°Q·|¡Bºô¸ôpºâ¬ã°Q·|¡B´¼¼z«¬¨®½ø»P¤½ ¸ô¨t²Î¬ã°Q·|¡B³æ´¹¤ù¨t²Î¥i¦A¥Î®Ö¤ß¡]IP¡^³]p§Þ³N¬ã°Q·|¡B²Ä¤Q©¡¶W¤j«¬¿nÅé¹q¸ô»P³]p§Þ³N¬ã°Q·|¡B³æ´¹¤ù¨t²Î¤¸¥ó´ú¸Õ§Þ³Nµu´Á½Òµ{µ¥¡C
l General Chair, VLSI Test Technology Workshop
(VTTW), Hsinchu, 2007¡C
l Panelist, Silicon Sea Belt Summit, Fukuoka, 2008¡C
l Panelist, IEEE ATS,
Taichung, 2009¡C
l Keynote Speaker, EDA Development Forum, Taipei,
2008¡C
l Keynote Speaker, VLSI Test Technology Workshop
(VTTW), Tainan, 2008¡C
l Keynote Speaker, IEEE Asian Test Symposium (ATS),
2009¡C
l Keynote Speaker, SPIE Lithography Asia¡ÐTaiwan 2009¡C
l Keynote Speaker, DATE 3D Integration Workshop,
Dresden, 2010¡C
l Invited Speaker, IEEE VLSI-DAT, Hsinchu, 2006¡C
l Invited Speaker, SEMICON Taiwan, 2009¡C
l Invited Speaker, Emerging Information and
Technology Conference, NCKU, Tainan, 2008¡C
l Invited Speaker, VDEC D2T Symposium, University of
Tokyo, Tokyo, 2008¡C
l Invited Speaker, IEEE
VTS, Santa Cruz, 2010¡C
l ³Ð¥ß°ê¤ºVLSI Test Technology Forum (VTTF)¡Aµ²¦X°ê¤º´ú¸Õ¬ã¨s¾ÇªÌ±M®a©w´Á»E·|¬ã°Q«nijÃD¡]¨£http://larc.ee.nthu.edu.tw/cww/vttf/¡^¡C
l ¦Ò¸Õ°|°ª´¶¦Ò¨å¸Õ©eû¡]1996-1999¡^¡C
l °ê»Ú¾Ç³N·|ij±Â½Ò¡]Tutorials¡^¡GASP-DAC 2000¡]°O¾ÐÅé´ú¸Õ¡^¡BASP-DAC 2001¡]SOC´ú¸Õ¡^¡BVTS 2004¡]°O¾ÐÅé´ú¸Õ¡^¡C
l °ê»Ú¾Ç³N·|ij®y½Í·|¥D«ù¤H¡GATS-98¡]·s¥[©Y¡A°O¾ÐÅé´ú¸Õ¡^¡BASP-DAC 2004¡]¤é¥»¡AIC´ú¸Õ¡^¡C
l ¥D¿ì²M¤j¿nÅé¹q¸ô³]p§Þ³N¬ãµo¤¤¤ß¡]DTC¡^ºtÁ¿¨t¦C¡]2001-2005¦~¦@Á|¿ì¤¤Q´X³õºtÁ¿¡^¡C
l °ê»Ú¾Ç³N´Á¥Z½s¿è»PÁ`½s¿è¡G
² Journal of Information Science and Engineering¡]JISE¡^, Special Issue on VLSI Testing¡]Guest Editor, 9/2000¡^
² Journal of Chinese Institute of Electrical
Engineers¡]JCIEE¡^¡]Editor,
2000-2003¡^
² International Journal of Electrical Engineering¡]IJEE, was JCIEE¡^¡]Editor-in-Chief, 2003-2006¡^
² International Journal of Electrical Engineering ¡]IJEE¡^¡]Chair of the Editorial Board, 2006-2009¡^
² Journal of Electronic Testing: Theory and
Applications¡]JETTA¡^¡]Editor since
2004¡^
² IEEE Design & Test of Computers¡]Editor since 2006¡^
² IEEE Transactions on Computer¡]Associate Editor since 2009¡^
² IEEE Transactions on CAD¡]Associate Editor since 2010¡^
l ¨üÁܾá¥ô¿Ô¸ß©eû¡G±X¤s¬ì¤j¤u¾Ç°|¡B°ê®a´¹¤ù¨t²Î³]p¤¤¤ß¡B¥æ¤jÁpµo¬ì¬ã¨s¤¤¤ß¡B»²¤j¹q¤l¨t¡B¤¤ì¤j¾Ç¹q¤l¨t¡Bªø©°¤j¾Ç¹q¾÷¨tµ¥¡C
l ¨üÁܺtÁ¿»P±Â½Ò¡G¥x¤j¹q¾÷¨t¡B¥x¤j¹q¤l©Ò¡B¥x¬ì¤j¹q¾÷¨t¡B¤¸´¼¹q¾÷¨t¡B¹q«H¬ã¨s©Ò¡B¤¤ì¹q¤l¤uµ{¨t¡B¥æ¤j¹q¤l¤uµ{¨t¡B¥æ¤j¸ê¤u¨t¡B¦¨¤j¸ê¤u©Ò¡B¤¤µØ¤j¾Ç¸ê¤u¨t¡B¤u¬ã°|¹q³q©Ò¡B¤u¬ã°|¹q¤l©Ò¡B¤¤¤s¬ì¾Ç°|¡B°ê®a°ª³t¹q¸£¤¤¤ß¡BÁpµØ¹q¤l¡B¥x¿n¹q¡BµØÄˬì§Þ¡Bª¿²Î¬ì§Þ¡B¦X®õ¥b¾ÉÅé¡B´¼ì¬ì§Þ¡B©ô§»¹q¤l¡B¦Û±jªÀ¡B¥@¬É¬ì§ÞÅU°ÝªÀ¡B¤¤¿³¹q¾÷¨t¡B¤¤¿³¸ê¬ì©Ò¡B¶³¬ì¤j¹q¤l¨t¡BÁp¦X¤u±M¡B±X¤s¬ì¤j¹q¤l¨t¡B³{¥Ò¸ê¤u©Ò¡B¤¤¥¿¹q¾÷¨t¡B¦¨¤j¹q¾÷¨t¡BªFµØ¤j¾Ç¸ê¤u¨t¡B¥x¥_Âå¾Ç°|¡B²±¸s¥b¾ÉÅé¡B౳Ьì§Þ¡B¤u¬ã°|¨t²Î´¹¤ù§Þ³N¤¤¤ß¡B«n¥x¬ì¤j¹q¤l¨t¡B¹s²Õ¥óÂø»x/SOC±À°ÊÁp·ù¡B«n¥[¤j¹q¾÷¨t¡]¬ü°ê¡^¡B»´ä¤¤¤å¤j¾Ç¡]»´ä¡^¡B¥v¤¦ºÖ¤j¾Ç¹q¾÷¨t¡]¬ü°ê¡^¡B¥[¦{¤j¾Ç ¡]UCSB¡^¡]¬ü°ê¡^¡BAxis Co.¡]¬ü°ê¡^¡B¤Ú¾¤²Ä¤»¤j¾Ç¡]ªk°ê¡^¡BLAAS-CNRS¡]ªk°ê¡^¡B²M¤j¹q¸£»P³q°T¬ì§Þ¬ãµo¤¤¤ß¡B²M¤j¿nÅé¹q¸ô³]p§Þ³N¬ãµo¤¤¤ß¡B·ç¬R¥b¾ÉÅé¡BµØ¨¹¹q¤l¡B¥xÆW¥b¾ÉÅé¨ó·|¡]TSIA¡^¡B¶Ô¯q§Þ³N¾Ç°|¹q¤l¨t¡B°ª¶¯¤j¾Ç¹q¾÷¨t¡B½«µØ¬ì§Þ¡B«Â²±¹q¤l¡B¬ì¾Ç¶é°Ï¹êÅ礤¾Ç¡B»´ä²z¤u¤j¾Ç¡]»´ä¡^¡BºÖ¹p¹q¤l¡BÁpµo¬ì§Þ¡B«ä·½¬ì§Þ¡Bi´¹¬ì§Þ¡BªFµØ¤j¾Ç¹q¾÷¨t¡B»²¤j¹q¤l¨t¡B¥¿×¬ì¤j¹q¤l¨t¡B²M¤j¤u·~¤uµ{¨t¡B²M¤j°Ê¾÷¨t¡B²M¤j¤Æ¤u¨t¡B¥x«n¤@¤¤¡B¤¤¿³§÷®Æ¨t¡B¹ü®v¤j¿nÅé¹q¸ô³]p©Ò¡B»²¤j²z¤u¾Ç°|¡BARM Co.¡]¬ü°ê¡^¡B¤O©ô¹q¤l¡BºÖ©£¿¤¬F©²¡]¤é¥»¡^¡B¹q¤l®É³ø¡B¤¤¤s¤j¾Ç¸ê¤u¨t¡B¥æ¤j§õ¥ß¥x´¬ì§ÞÁ¿®yµ¥¡B¥x¤j¹q«H©Ò¡C
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