EE6250 & EE6251: VLSI Testing and Design for Testability

EE6253: Semiconductor Memory Testing

Cheng-Wen Wu
cww@ee.nthu.edu.tw

• EE6250 (Spring 2002): VLSI Testing and Design for Testability (I)
• EE6251 (Spring 2006): VLSI Testing and Design for Testability (II)
• EE6253 (Spring 2005): Semiconductor Memory Testing
• Quotable quotes